Pure Appl. Chem., 1985, Vol. 57, No. 8, pp. 1133-1152
http://dx.doi.org/10.1351/pac198557081133
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
General aspects of trace analytical methods: Part VI. Trace analysis of semiconductor materials - Part A: Bulk analysis
Individual author index pages
Other PAC articles by these authors
Solid state mass spectrometry for materials science
        
        Separation and Preconcentration of Trace Substances - V. Microscale preconcentration techniques for trace analysis
        
        Critical evaluation of calibration procedures for distribution analysis of dopant elements in silicon and gallium arsenides
        
        New methods for preconcentration and determination of heavy metals in natural water
        
        General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
        
        Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
        
        Preconcentration in inorganic trace analysis
        
        Determination of microelements in geological samples
        
        Extraction kinetics of metal chelates
        
        