Pure Appl. Chem., 1985, Vol. 57, No. 8, pp. 1153-1170
http://dx.doi.org/10.1351/pac198557081153
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
Individual author index pages
Other PAC articles by these authors
Solid state mass spectrometry for materials science
Preparation of biological samples for ion microscopy (Technical Report)
Separation and Preconcentration of Trace Substances - V. Microscale preconcentration techniques for trace analysis
Critical evaluation of calibration procedures for distribution analysis of dopant elements in silicon and gallium arsenides
New methods for preconcentration and determination of heavy metals in natural water
Distribution analysis of major and trace elements through semiconductor layers of changing matrix using secondary ion mass spectrometry (SIMS)
General aspects of trace analytical methods: Part VI. Trace analysis of semiconductor materials - Part A: Bulk analysis
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
General aspects of trace analytical methods - V. Comparison of the abilities of trace analytical methods to determine small amounts or concentrations of elements
Preconcentration in inorganic trace analysis
Determination of microelements in geological samples
General aspects of trace analytical methods I. Methods of calibration in trace analysis
Extraction kinetics of metal chelates