Pure Appl. Chem., 2000, Vol. 72, No. 1-2, pp. 165-177
http://dx.doi.org/10.1351/pac200072010165
High-density femtosecond transient absorption spectroscopy of semiconductor nanoparticles. A tool to investigate surface quality
Individual author index pages
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Some properties of spherical and rod-shaped semiconductor and metal nanocrystals
        
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